结合多信号模型与遗传算法的板级电路测点选取方法 (Measuring Point Selection Method of Board-level Circuit Based on Multi-signal Model and Genetic Algorithm)

Weiwen Shi, Xueqi Wang, Kaiyin Fan, Mingjun Wang. 结合多信号模型与遗传算法的板级电路测点选取方法 (Measuring Point Selection Method of Board-level Circuit Based on Multi-signal Model and Genetic Algorithm). 计算机科学, 45(8):295-299, 2018. [doi]

Abstract

Abstract is missing.