Yukiko Shibasaki, Koji Asami, Akemi Hatta, Riho Aoki, Anna Kuwana, Haruo Kobayashi 0001. Study on Crest Factor Controlled Multi-Tone Signal for Analog RF Circuit Testing. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 133-134, IEEE, 2020. [doi]
Abstract is missing.