A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience

Kyu-Nam Shim, Jiang Hu. A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 170-177, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.