Yoshihiro Shima, Katsumi Marukawa, Hiroshi Shinjo, Kazuki Nakashima, Masashi Koga, Tatsuhiko Kagehiro. A Recognition Method for Skewed Four-State Bar Codes by Using Raster-Scanned Binary Images and Connected Components. In Proceedings of the IAPR Conference on Machine Vision Applications (IAPR MVA 2000), November 28-30, 2000, Tokyo, Japan. pages 48-50, 2000.
Abstract is missing.