Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs

Hiroshi Shimomura, Kuniyuki Kakushima, Hiroshi Iwai. Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs. IEICE Transactions, 93-C(5):678-684, 2010. [doi]

Abstract

Abstract is missing.