Hongjoong Shin, Byoungho Kim, Jacob A. Abraham. Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 412-419, IEEE Computer Society, 2006. [doi]
Abstract is missing.