Semantic Patent Analysis System Based on Big Data

Junghoon Shin, Sangjun Lee, Taehyung Wang. Semantic Patent Analysis System Based on Big Data. In 11th IEEE International Conference on Semantic Computing, ICSC 2017, San Diego, CA, USA, January 30 - February 1, 2017. pages 284-285, IEEE Computer Society, 2017. [doi]

Abstract

Abstract is missing.