Between-Core Vector Overlapping for Test Cost Reduction in Core Testing - researchr publication related

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Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka. Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 268-273, IEEE Computer Society, 2003. [doi]

The following publications are possibly variants of this publication:

A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test ArchitectureTsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa. ats 2005: 366-371 [doi]

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