Artificial Neural Network Based Test Escape Screening Using Generative Model - researchr publication

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Michihiro Shintani, Michiko Inoue, Yoshiyuki Nakamura. Artificial Neural Network Based Test Escape Screening Using Generative Model. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-8, IEEE, 2018. [doi]

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