Kazuki Shirahata, Takeshi Mizushima, Tasuku Fujibe, Hidenobu Matsumura, Tomoyuki Itakura, Masahiro Ishida, Daisuke Watanabe, Shin Masuda. An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 263-268, IEEE Computer Society, 2016. [doi]
Abstract is missing.