Muhammad Faizan Shirazi, Kibeom Park, Ruchire Eranga Wijesinghe, Hyosang Jeong, Sangyeob Han, Pil Un Kim, Mansik Jeon, Jeehyun Kim. Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography. Sensors, 16(10):1598, 2016. [doi]
Abstract is missing.