Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies

Joseph Shor, Kosta Luria, Dror Zilberman. Ratiometric BJT-based thermal sensor in 32nm and 22nm technologies. In 2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, San Francisco, CA, USA, February 19-23, 2012. pages 210-212, IEEE, 2012. [doi]

Abstract

Abstract is missing.