Vishal Shrivastav, Satya Gautam Vadlamudi, P. P. Chakrabarti, Dipankar Das 0002, Purnendu Sinha. Finding Critical Components in Embedded Control Systems Sensitive to Quality-Faults. In International Symposium on Electronic System Design, ISEDs 2012, Kolkata, India, December 19-22, 2012. pages 167-171, IEEE, 2012. [doi]
Abstract is missing.