Aman Shrivastava, William Adorno, Yash Sharma, Lubaina Ehsan, S. Asad Ali, Sean R. Moore, Beatrice C. Amadi, Paul Kelly, Sana Syed, Donald E. Brown. Self-attentive Adversarial Stain Normalization. In Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei 0001, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani, editors, Pattern Recognition. ICPR International Workshops and Challenges - Virtual Event, January 10-15, 2021, Proceedings, Part I. Volume 12661 of Lecture Notes in Computer Science, pages 120-140, Springer, 2020. [doi]
Abstract is missing.