Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process

Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong Hua Zhou, Michael G. Pecht. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process. IEEE Transactions on Reliability, 61(1):50-67, 2012. [doi]

Abstract

Abstract is missing.