Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study

Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, RĂ©mi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy 0001, Francis Calmon. Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. In 47th ESSCIRC 2021 - European Solid State Circuits Conference, ESSCIR 2021, Grenoble, France, September 13-22, 2021. pages 143-146, IEEE, 2021. [doi]

Abstract

Abstract is missing.