M. Sultan M. Siddiqui, Ruchi Sharma, Van Loi Le, Taegeun Yoo, Ik Joon Chang, Tony Tae-Hyoung Kim. A Radiation Hardened SRAM with Self-refresh and Compact Error Correction. In International SoC Design Conference, ISOCC 2018, Daegu, South Korea, November 12-15, 2018. pages 235-236, IEEE, 2018. [doi]
Abstract is missing.