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Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties

Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk. Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors, 24(17):5649, September 2024. [doi]

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