Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk. Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors, 24(17):5649, September 2024. [doi]
@article{SikoraGBPPRG24,
title = {Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties},
author = {Andrzej Sikora and Krzysztof Gajewski and Dominik Badura and Bartosz Pruchnik and Tomasz Piasecki and Kamil Raczkowski and Teodor P. Gotszalk},
year = {2024},
month = {September},
doi = {10.3390/s24175649},
url = {https://doi.org/10.3390/s24175649},
researchr = {https://researchr.org/publication/SikoraGBPPRG24},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {24},
number = {17},
pages = {5649},
}