Automatic test case generation for PLC programs using coverage metrics

Hendrik Simon, Nico Friedrich, Sebastian Biallas, Stefan Hauck-Stattelmann, Bastian Schlich, Stefan Kowalewski. Automatic test case generation for PLC programs using coverage metrics. In 20th IEEE Conference on Emerging Technologies & Factory Automation, ETFA 2015, Luxembourg, September 8-11, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

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