Ozgur Sinanoglu, Alex Orailoglu. A novel scan architecture for power-efficient, rapid test. In Lawrence T. Pileggi, Andreas Kuehlmann, editors, Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002, San Jose, California, USA, November 10-14, 2002. pages 299-303, ACM, 2002. [doi]
Abstract is missing.