Ozgur Sinanoglu, Alex Orailoglu. Fast and Energy-Frugal Deterministic Test Through Test Vector Correlation Exploitation. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 325-333, IEEE Computer Society, 2002. [doi]
Abstract is missing.