E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods

Eshan Singh, Clark W. Barrett, Subhasish Mitra. E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. In Rupak Majumdar, Viktor Kuncak, editors, Computer Aided Verification - 29th International Conference, CAV 2017, Heidelberg, Germany, July 24-28, 2017, Proceedings, Part II. Volume 10427 of Lecture Notes in Computer Science, pages 104-125, Springer, 2017. [doi]

Abstract

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