Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study

Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad R. Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark Barrett, Wolfgang Ecker, Subhasish Mitra. Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 1000-1005, IEEE, 2019. [doi]

@inproceedings{SinghDSSGFSKBEM19,
  title = {Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study},
  author = {Eshan Singh and Keerthikumara Devarajegowda and Sebastian Simon and Ralf Schnieder and Karthik Ganesan and Mohammad R. Fadiheh and Dominik Stoffel and Wolfgang Kunz and Clark Barrett and Wolfgang Ecker and Subhasish Mitra},
  year = {2019},
  doi = {10.23919/DATE.2019.8715271},
  url = {https://doi.org/10.23919/DATE.2019.8715271},
  researchr = {https://researchr.org/publication/SinghDSSGFSKBEM19},
  cites = {0},
  citedby = {0},
  pages = {1000-1005},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
  publisher = {IEEE},
  isbn = {978-3-9819263-2-3},
}