Prashant Singh, Eric Karl, Dennis Sylvester, David Blaauw. Dynamic NBTI management using a 45nm multi-degradation sensor. In Jacqueline Snyder, Rakesh Patel, Tom Andre, editors, IEEE Custom Integrated Circuits Conference, CICC 2010, San Jose, California, USA, 19-22 September, 2010, Proceedings. pages 1-4, IEEE, 2010. [doi]
Abstract is missing.