Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh. Binning for IC Quality: Experimental Studies on the SEMATECH Data. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 4-10, IEEE Computer Society, 1998. [doi]
@inproceedings{SinghLSN98,
title = {Binning for IC Quality: Experimental Studies on the SEMATECH Data},
author = {Adit D. Singh and David R. Lakin II and Gaurav Sinha and Phil Nigh},
year = {1998},
url = {http://dlib2.computer.org/conferen/dft/8832/pdf/88320004.pdf},
tags = {data-flow},
researchr = {https://researchr.org/publication/SinghLSN98},
cites = {0},
citedby = {0},
pages = {4-10},
booktitle = {13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-8832-7},
}