D. Singh, O. D. Restrepo, P. P. Manik, N. Rao Mavilla, H. Zhang, Peter C. Paliwoda, S. Pinkett, Y. Deng, E. Cruz Silva, J. B. Johnson, M. Bajaj, S. Furkay, Z. Chbili, A. Kerber, C. Christiansen, S. Narasimha, E. Maciejewski, S. Samavedam, C. H. Lin. Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
@inproceedings{SinghRMMZPPDSJB18,
title = {Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies},
author = {D. Singh and O. D. Restrepo and P. P. Manik and N. Rao Mavilla and H. Zhang and Peter C. Paliwoda and S. Pinkett and Y. Deng and E. Cruz Silva and J. B. Johnson and M. Bajaj and S. Furkay and Z. Chbili and A. Kerber and C. Christiansen and S. Narasimha and E. Maciejewski and S. Samavedam and C. H. Lin},
year = {2018},
doi = {10.1109/IRPS.2018.8353650},
url = {https://doi.org/10.1109/IRPS.2018.8353650},
researchr = {https://researchr.org/publication/SinghRMMZPPDSJB18},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}