Manik Singhal, Prakash Lekkala, M. R. Shivashankar, Parameshwaran S. Iyer. Data mining driven visual pattern discovery: RBEI-IYER-MC2. In Min Chen, David S. Ebert, Chris North, editors, 2014 IEEE Conference on Visual Analytics Science and Technology, VAST 2014, Paris, France, October 25-31, 2014. pages 361-362, IEEE, 2014. [doi]
Abstract is missing.