Abhishek A. Sinkar, Nam Sung Kim. Analyzing and minimizing effects of temperature variation and NBTI on active leakage power of power-gated circuits. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 791-796, IEEE, 2010. [doi]
Abstract is missing.