Optimising First-Class Pattern Matching

Jeff Smits, Toine Hartman, Jesper Cockx. Optimising First-Class Pattern Matching. In Bernd Fischer, Lola Burgueño, Walter Cazzola, editors, Proceedings of the 15th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2022, Auckland, New Zealand, December 6-7, 2022. pages 74-83, ACM, 2022. [doi]

@inproceedings{SmitsHC22,
  title = {Optimising First-Class Pattern Matching},
  author = {Jeff Smits and Toine Hartman and Jesper Cockx},
  year = {2022},
  doi = {10.1145/3567512.3567519},
  url = {https://doi.org/10.1145/3567512.3567519},
  researchr = {https://researchr.org/publication/SmitsHC22},
  cites = {0},
  citedby = {0},
  pages = {74-83},
  booktitle = {Proceedings of the 15th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2022, Auckland, New Zealand, December 6-7, 2022},
  editor = {Bernd  Fischer and Lola Burgueño and Walter Cazzola},
  publisher = {ACM},
  isbn = {978-1-4503-9919-7},
}