Aya Soffer, Hanan Samet. Using negative shape features for logo similarity matching. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 571-573, IEEE, 1998. [doi]
Abstract is missing.