Oliver Soffke, Peter Zipf, Tudor Murgan, Manfred Glesner. A signal theory based approach to the statistical analysis of combinatorial nanoelectronic circuits. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 632-637, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
Abstract is missing.