Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements

Ahish Mysore Somashekar, Spyros Tragoudas. Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 481-486, IEEE, 2013. [doi]

Abstract

Abstract is missing.