MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs

DongSup Song, Jin-Ho Ahn, Tae-Jin Kim, Sungho Kang. MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Transactions, 91-D(4):1197-1200, 2008. [doi]

Abstract

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