Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults

Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park. Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on Circuits and Systems, 56-II(1):56-60, 2009. [doi]

Abstract

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