An Efficient Secure Scan Design for an SoC Embedding AES Core

Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park. An Efficient Secure Scan Design for an SoC Embedding AES Core. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1, IEEE, 2008. [doi]

Abstract

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