Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen. Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electronic Express, 16(8):20190141, 2019. [doi]

Abstract

Abstract is missing.