Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia. A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 140-147, IEEE, 2004. [doi]
Abstract is missing.