Warin Sootkaneung, Pipatphon Lapamonpinyo, Sasithorn Chookaew, Suppachai Howimanporn. NBTI in FinFET Circuits under the Temperature Effect Inversion. In 2016 IEEE Intl Conference on Computational Science and Engineering, CSE 2016, and IEEE Intl Conference on Embedded and Ubiquitous Computing, EUC 2016, and 15th Intl Symposium on Distributed Computing and Applications for Business Engineering, DCABES 2016, Paris, France, August 24-26, 2016. pages 343-350, IEEE Computer Society, 2016. [doi]
Abstract is missing.