Mathilde Soucarros, Jessy Clédière, Cécile Canovas-Dumas, Philippe Elbaz-Vincent. Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor. J. Electronic Testing, 29(3):367-381, 2013. [doi]
@article{SoucarrosCCE13, title = {Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor}, author = {Mathilde Soucarros and Jessy Clédière and Cécile Canovas-Dumas and Philippe Elbaz-Vincent}, year = {2013}, doi = {10.1007/s10836-013-5356-1}, url = {http://dx.doi.org/10.1007/s10836-013-5356-1}, researchr = {https://researchr.org/publication/SoucarrosCCE13}, cites = {0}, citedby = {0}, journal = {J. Electronic Testing}, volume = {29}, number = {3}, pages = {367-381}, }