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IC Defects-Based Testability Analysis

José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira. IC Defects-Based Testability Analysis. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 500-509, IEEE Computer Society, 1991.

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