Theofilos Spyrou, Sarah A. El-Sayed, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. Stratigopoulos. Reliability Analysis of a Spiking Neural Network Hardware Accelerator. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 370-375, IEEE, 2022. [doi]
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