Raghuram Srinivasan, Harold W. Carter. A taylor series methodology for analyzing the effects of process variation on circuit operation. In Fabrizio Lombardi, Sanjukta Bhanja, Yehia Massoud, R. Iris Bahar, editors, Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009. pages 203-208, ACM, 2009. [doi]
Abstract is missing.