A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies

Bodapati Srinivasu, K. Sridharan. A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies. IEEE Transactions on Reliability, 66(2):440-457, 2017. [doi]

Abstract

Abstract is missing.