Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development

Wolfgang Stadler, K. Esmark, Harald Gossner, M. Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, E. Gornik. Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development. Microelectronics Reliability, 42(9-11):1267-1274, 2002. [doi]

Abstract

Abstract is missing.