A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing - researchr publication

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Christina Stadler, Xenia Flamm, Thomas Gruber, Anatoli Djanatliev, Reinhard German, David Eckhoff. A stochastic V2V LOS/NLOS model using neural networks for hardware-in-the-loop testing. In 2017 IEEE Vehicular Networking Conference, VNC 2017, Torino, Italy, November 27-29, 2017. pages 195-202, IEEE, 2017. [doi]

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