Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems

George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Foster F. Dai, Victor P. Nelson. Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 11-19, IEEE Computer Society, 2009. [doi]

Abstract

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