Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza. On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC). In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.