Optical diagnosis of excess I::DDQ:: in low power CMOS circuits

Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen. Optical diagnosis of excess I::DDQ:: in low power CMOS circuits. Microelectronics Reliability, 42(9-11):1689-1694, 2002. [doi]

Abstract

Abstract is missing.