Luca Sterpone, Davide Sabena, Salvatore Campagna, Matteo Sonza Reorda. Fault injection analysis of transient faults in clustered VLIW processors. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 207-212, IEEE, 2011. [doi]
Abstract is missing.